Recording a snapshot diffraction image


Snapshot with angles

  1. Change the sub-screen to the Center display by clicking on the corresponding tab.
  2. Select the proper shapshot-mode by clicking on the Snapshot with angles sub-tab.

  3. You can then modify the measurement conditions in this >Snapshot with angles< sub-tab.
  4. Click the [Snapshot] button to start the measurement.
  5. Eventually, you can perform more sophisticated measurements as indicated in the [Advanced ...] section.

Explanation of each functions in the >Snapshot with angles< sub-tab

  • >Beam size<
    Represents the horizontal and vertical width before the sample.
    • The slit size can be changed by adjusting the sliding bar, by selecting pre-defined values from the pull-down menu, or by directly typing the desired value into the associated box.
    • The beam size nearly equals the slit size. These dimensions are displayed in purple on the centering screen.
  • >File name<
    Indicates the name of the saved file.
    • The name is composed of three parts: the prefix, the run number, and the file number.
    • Up to fourteen characters can be used for the prefix.

    • Please do NOT use the character "_" (underscore) for the prefix name, as several analysis software will possibly misread such file.
    • Each diffraction image taken by the snapshot will be saved into the sub-directory named "Snap".
      (Please note that you can still change the settings for the sub-directory and prefix names using file name manager, accessible from the menu bar: [Special]-[Files/Directories name]
  • >Omega (deg.)<
    Represents the value for the starting angle.
    This starting angle is not limited within the range of 0 to 360 degrees. The absolute value will be automatically calculated and decided accordingly.
    You can eventually set several angles separated by a "," (coma).
  • >Osc. width (deg.)<
    Represents the oscillation width, by which the crystal will be rotated during exposure.
    Zero degree cannot be set, as it means that the crystal stays still.
  • >Exposure Time (sec.)<
    Represents the amount of time the sample will be exposed to X-ray irradiation.
  • >Max. resolution<
    Represent the maximum resolution measurable. This value is calculated from the energy of the wavelength, camera distance and camera height.
  • More detailed measurement conditions can be set using the [Advanced ...] button.

Snapshot with positions

  1. Change the sub-screen to the Center display by clicking on the corresponding tab.
  2. Select the proper shapshot-mode by clicking on the Snapshot with positions sub-tab.
  3. You can then modify the measurement conditions in this >Snapshot with positions< sub-tab.
  4. Click the [Start] button to start the measurement.
  5. Eventually, you can perform more sophisticated measurements as indicated in the [Advanced ...] section.

Explanation of each functions in the >Snapshot with positions< sub-tab

  • >Position editor<
    • mode
      • preview: displays or not the selected position on the screen (Default set to yes).
      • Free: measures from randomly selected positions.
        Please note that the target menu will appear by clicking with the mouse right-click within the centering screen. You will need then to click the "Add" button.
        Figure 1

        The figure 1 represents the display after right-clicking on the centering screen.

        Figure 2

        The figure 2 represents the display after clicking the "Add" menu. The target looks like a green frame.

      • Division: measures selected positions linearly separated at equal intervals.
        1. Choose the number of snapshot positions to be measured using the Number of points option
        2. Within the centering screen, click-and-keep (do not release) with the mouse right-button at the starting point of the series.
        3. Move the cursor to the desired end point, and release the right-button.
        4. Confirm the selection by clicking "Add".

        Figure 3

        The figure 3 represents the display once the mouse right-button has been released.

        Figure 4

        The figure 4 represents the display that after confirmation by clicking the "Add" button.

    • How to delete the set measurement position.
      • Deleting the selected position:
        Click the downward arrow, and choose the frame number to be deleted. Then click the [Delete selected] to remove the frame.
      • Deleting all:
        You can either click the [Delete all] button, or change the sub-tab to >Snapshot with angles<.

    • >Beam size<
      Represents the horizontal and vertical width before the sample.
      • The slit size can be changed by adjusting the sliding bar, by selecting pre-defined values from the pull-down menu, or by directly typing the desired value into the associated box.
      • The beam size nearly equals the slit size. These dimensions are displayed in purple on the centering screen.

    • >File name<
      Indicates the name of the saved file.
      • The name is composed of four parts: the prefix, the P <position number>, the run number, and the file number.
      • Up to seventy characters can be used for the prefix.

      • Please do NOT use the character "_" (underscore) for the prefix name, as several analysis software will possibly misread such file.
      • Each diffraction image taken by the snapshot will be saved into the sub-directory named "Snap".
        (Please note that you can still change the settings for the sub-directory and prefix names using file name manager, accessible from the menu bar: [Special]-[Files/Directories name]

    • >Measure at<
      Represents the setting of the starting angle, to which sixty degrees will be added. Sixty degrees correspond to the slope of the crystal monitoring camera, unchangeable.

    • >Osc. width (deg.)<
      Represents the oscillation width, by which the crystal will be rotated during exposure.
      Zero degree cannot be set, as it means that the crystal stays still.

    • >Exposure Time (sec.)<
      Represents the amount of time the sample will be exposed to X-ray irradiation.

    • >Max. resolution<
      Represent the maximum resolution measurable. This value is calculated from the energy of the wavelength, camera distance and camera height.

    • More detailed measurement conditions can be set using the [Advanced ...] button.

Appendix:Snapshot And Collect Advance





Table of the readout settings for each beamline.
Initial setting of each BL snapshot collect
BL-1A off off
BL-5A hard hard
BL-17A soft off
NW-12A hard hard
NE-3A off off
  • > Wavelength<
    The energy of the coming X-rays.
  • >Detector position<
    1. Distance
      Represents the distance existing between the detector and the sample.
    2. Height
      Represents the offset value of the detector's height.
  • >Slit<
    Divergence: represents the deterrence of X-ray dispersion. In other words, it collimates the X-rays when the detector distance is far from the sample.
    Normal: the collimation is done with a single slit (Default).
    Parallel: the collimation is done with double slits. Although the intensity of the X-rays decreases, a high parallelism is obtained. This function is effective for the measurement of samples with large lattice constants.
  • >Transmittance<
    Represents the transmittance of the incident X-ray. The material used is aluminum.
  • >Data acquisition<
    1. Dark current:the initial image is revised (noise-reduced) with a dark image data.
    2. This program runs when the user selects the Yes radio button. The exposure time of the dark image will be the same as the initial image, meaning that the total exposure will take twice the time as what is specified in the settings.
    3. Binning:choice of the detector readout type.
      off:the readout type is in normal operation.
      software:the readout type is in software processing operation (meaning that the image size is one forth of the "binning off" picture size.).
      hardware:the readout type is in hardware processing operation (meaning that the readout time is even faster than when in software processing operation.).


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